Minutes, IBIS Quality Committee

02 October 2012

11:00-12:00 EST (08:00-09:00 PST)

ROLL CALL

Cisco Systems:                      Tony Penaloza
Ericsson:                         * Anders Ekholm
Green Streak Programs:              Lynne Green
Huawei Technologies:                Guan Tao
IBM:                                Bruce Archambeault
                                    Greg Edlund
Intel                             * Michael Mirmak
IOMethodology:                    * Lance Wang
Mentor Graphics:                    John Angulo
Micron Technology:                  Moshiul Haque,
                                    Randy Wolff
Nokia Siemens Networks:             Eckhard Lenski
QLogic Corp.:                       James Zhou
Signal Consulting Group:            Tim Coyle
Signal Integrity Software         * Mike LaBonte
Teraspeed Consulting Group:       * Bob Ross
Texas Instruments:                  Pavani Jella

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for opens and IBIS related patent disclosures:

- None

AR Review:

- Mike produce starter set of test waveforms
  - Done
  - Michael M: Is this for correlating or could models be created from them?
  - Mike L: These are contrived models

- Lance check on patent status for correlation methods
  - Spoke with attorney last week
  - Needs to check with status in China
  - No issues in U.S.

New items:

Possible presentation for upcoming Asia summit meetings:
- Bob: Lance is doing a quality related presentation
  - We probably have no need 

Set of waveforms to use in comparing different correlation metrics:
- Mike showed the waveforms
- Bob: I would prefer single ended waveforms
- Mike showed the previous FOM presentation
- Mike: It would be good to have an FOM that clearly differentiates between good and bad
- Anders: It sounds like you are looking for measurement of specific features
- Mike: We might as a group decide on acceptable quality levels
  - The waveforms could be set to be at the threshold
- Bob: That would be subjective
- Mike showed David Banas' 2007 summit presentation
- Mike: This does not produce a single number FOM
  - Maybe different thresholds are needed for each parameter
- Anders: What are we trying to achieve?
- Mike: We need a standard metric for models we produce
- Anders: Any standard should have a tool behind it
  - The FOM produces values that are too high
- Mike created a new test waveform with a long flat period
- Mike: The IBIS FOM 
- Anders: The flat period is of less consequence
  - FSV might be better, but we have to decide how to measure the features

- Anders: AMI is still not stable enough to do a check list
- Mike: We may have a long wait before there is any change
- Anders: Is Dependency Table in 5.1?
- Mike: No
- Anders: It will not be simple to check AMI models

- Anders: We check that models fall within the process corner envelope
- Lance: It would be good to have CSV for each of these test waveforms.

AR: Mike post spreadsheet plus CSV files to web archive

AR: Mike add FOM to spreadsheet

AR: Mike contact David Banas for an update on his FSV method

Review of group meeting schedule:

- Lance: There might be more interest if we worked on golden waveforms

Next meetings:
- Next meetings Oct 16 and Oct 30

- Meeting ended at 12:10 ET